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Optoelectronic on-chip characterization of ultrafast electricdevices: Measurement techniques and applications |
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| Authors: | Pfeifer T Heiliger H-M Loffler T Ohlhoff C Meyer C Lupke G Roskos HG Kurz H |
| Affiliation: | Inst. fur Halbleitertechnik II, Rheinisch-Westfalisches Tech. Hochschule, Aachen; |
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