功耗限制下RTL数据通路扫描测试调度方法 |
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引用本文: | 田斌,许睿,王泽成. 功耗限制下RTL数据通路扫描测试调度方法[J]. 微计算机信息, 2012, 0(2): 145-147 |
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作者姓名: | 田斌 许睿 王泽成 |
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作者单位: | 湖南大学软件学院 |
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摘 要: | 本文提出了利用RTL数据通路中的寄存器构造成移位扫描寄存器来测试功能模块的方法,同时提出一种改进的模块调度思想,实现在功耗限制下的测试调度。实验结果表明本文所给出的测试产生算法与调度算法对于由全加器和半加器构成的功能模块具有良好的性能和实用性。
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关 键 词: | 可测试性设计 寄存器传输级 扫描测试 测试调度 |
A Scheduling Scan test Method on RTL Data Path Under Power Constraints |
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Affiliation: | (Software School,Hunan University,Changsha 410082,China) TIAN Bin XU Rui WANG Zhi-qiang |
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Abstract: | This paper presents the way of using Register as scan chain to test data path.At the same time,an improved module scheduling ideas also give to achieve the test scheduling under power constraints.For the computing modules composed of full adders and half adder,the experimental results show that the given test generation algorithm and scheduling have good performance and practicality. |
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Keywords: | design for testability Register Transfer Level Scan test Scheduling test |
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