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智能交流接触器专用芯片系统的测试
引用本文:杨喆,姚建军,冯涛,白浩博,戴鹏程.智能交流接触器专用芯片系统的测试[J].低压电器,2009(15):20-24.
作者姓名:杨喆  姚建军  冯涛  白浩博  戴鹏程
作者单位:陕西工业技术研究院,陕西,西安,710054
摘    要:介绍了一种自主开发的智能交流接触器专用芯片系统的测试情况。简单描述了智能交流接触器控制原理以及专用芯片的基本框架和应用系统,重点介绍了专用芯片的测试流程和相应流程的测试软件,并对整个系统进行了产品节能降耗性能测试。对CJ20-400接触器采用智能交流接触器专用芯片系统控制进行了全面的测试研究。

关 键 词:专用芯片  测试  交流接触器

Testing of the ASIC System of Intelligent AC Contactor
YANG Zhe,YAo Jianjun,FENG Tao,BAI Haobo,DAI Pengcheng.Testing of the ASIC System of Intelligent AC Contactor[J].Low Voltage Apparatus,2009(15):20-24.
Authors:YANG Zhe  YAo Jianjun  FENG Tao  BAI Haobo  DAI Pengcheng
Affiliation:YANG Zhe,YAO Jianjun,FENG Tao,BAI Haobo,DAI Pengcheng(Shaanxi Industrial Technology Research Institute,Xi'an 710054,China)
Abstract:The testing of self-developed ASIC system for intelligent AC contactor was introduced.The control theory of intelligent AC contactor,basic framework and applications of the ASIC was described in brief.The testing flow of the ASIC system,the flow of testing software and the testing of the entire system energy-saving were expounded.It was tested and studied roundly that the CJ20-400 contactor was controlled by using the ASIC system.
Keywords:application specific integrated circuit(ASIC)  test  AC contactor  
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