Influence of surface roughness on the calculation of optical constants of a metallic film by attenuated total reflection |
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Authors: | Lee C C Jen Y J |
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Affiliation: | Institute of Optical Science, National Central University, Chung-Li, Taiwan 320. cclee@ios704.ios.ncu.edu.tw |
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Abstract: | ![]() The measured optical-constant errors that arise in the Kretschmann configuration from surface roughness have been analyzed. The broadening of the half-width and the change in the reflection minimum of the attenuated-total-reflection curve that are due to the surface roughness are described. Calculation of the correct optical constants and silver-film thickness is demonstrated. |
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