| 基于C＋＋Builder数据库的数字芯片测试系统软件设计 |
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| 引用本文： | 蒋乃波.基于C＋＋Builder数据库的数字芯片测试系统软件设计[J].电子质量,2010(5):10-12. |
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| 作者姓名： | 蒋乃波 |
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| 作者单位： | 中国电子科技集团公司第四十一研究所,安徽,蚌埠233006 |
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| 摘 要： | 针对生产数字芯片种类多数量大和测试方法自动化程度低的问题，设计了一种基于C＋＋Builder数据库技术的数字芯片测试系统．实现数字芯片测试的自动化、可视化，从而提高了测试系统的效率，并可实现数字芯片的准确故障定位，根据检测数据进行故障分析，适时提供了维修指南，有效弥补了现有检测手段与方法的不足。
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| 关 键 词： | c＋＋Builder 数据库 数字芯片测试 测试数据 |
Software Design of IC Test System Based on C++Builder Database |
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| Jiang Nai-bo.Software Design of IC Test System Based on C++Builder Database[J].Electronics Quality,2010(5):10-12. |
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| Authors: | Jiang Nai-bo |
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| Affiliation: | Jiang Nai-bo (The 41st Institute of China Electronic Technology group Corporation, Anhni Bengbu 233006) |
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| Abstract: | Though there are varieties and large quantity of IC now. most of IC test means do not perform well in aspect of automation. To solve the problem, the author has designed an IC test system based on C＋＋Builder database, which has realized both automation and visualization of the test and thus enhanced the efficiency of the system. Besides that, the system can also locate IC faults with accuracy. It does fault analysis on the test data and offers repair guide at places where necessary, which has effectively improved the existing test methods. |
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| Keywords: | C++ Builder |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
