A comprehensive study of various etch processes for the removal of silicide-block-film in submicron CMOS technologies |
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Authors: | Rui Li Jun Wang Zhenhai Sun Yaoqi Dong Weiran KongLiujiang Yu Jun HeXiaohua Cheng Chingdong Wang |
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Affiliation: | a Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, People’s Republic of China b Graduate School of Chinese Academy of Sciences, Beijing 100049, People’s Republic of China c Grace Semiconductor Manufacturing Corporation, Shanghai 201203, People’s Republic of China |
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Abstract: | The removal of silicide-block-film is crucial for device stability, reliability and subsequent silicide formation. In this paper, various silicide block etch processes, i.e. dry and wet etch, were studied and compared. Possible plasma charging damage during dry etch might caused unstable PMOS threshold voltage (Vth) during H2 annealing. The impacts of the plasma-process-induced-damage (PPID), including Vth shift, its channel length dependency, and its thermal stability were investigated. The PPID can be eliminated by reducing bias power and magnetic field, while sacrificing etch rate (ER) and equipment throughput. The main advantages of wet etch are immunity from PPID, and little surface damage resulting in uniform silicide formation. However, it also has disadvantages: buffered oxide etchant (BOE) leads to the appearance of poly pinholes, and diluted hydrofluoric acid (DHF) peels the photoresist (PR) off. Therefore, wet etch can only be used in the situation of short etching time such as the combined dry and wet etch. |
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Keywords: | Silicide-block-film Dry etch Wet etch Threshold voltage shift |
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