基于CDEGS的裸导体表面电场强度分析

DL/T 5222-2005《导体和电器选择设计技术规定》提供了裸导体可不验算电晕的最小外径的计算公式,选定的导体表面电场强度水平是否满足Q/GDW 551-2010《变电站控制电晕噪声技术导则(导体金具类)》等相关规范的电晕控制要求并有多少裕度不得而知,且应用于750 kV、1000 kV电压等级的经验不多。本文基于CDEGS仿真计算软件,对按DL/T 5222-2005规范选定的可不校验电晕的最小外径的导体表面电场强度进行了核算。结果表明按DL/T 5222-2005规范进行750 kV、1000 kV导体电晕最小外径时是可靠的,且海拔1000 m及以下全面电晕电场强度E0宜取2000 V/mm。

Field Intensity Analysis of Bare Conductor Based on CDEGS

DL/T 5222-2005《Design technical rule for selecting conductor and electrical equipment》provides the formula of the minimum corona outer diameter for bare conductor.Conductor surface field selected whether meet the relevant standard such as Q/GDW 551-2010《Guide of corona noise control for substation(conductor and fittings)》and whether have a appropriate margin is unknown,and applying to 750 kV,1000 kV lack of experience.Based on the CDEGS simulation calculation software,the surface electric field intensity of the conductor with the smallest outer diameter of the calibrated corona that is selected according to the DL/T 5222-2005 specification is calculated.The results show that it is reliable to carry out the minimum outer diameter of 750 kV and 1000 kV conductor corona according to DL/T 5222-2005 specification,and the full corona electric field intensity E0 of 1000 m and below should be 2000 V/mm.