| 真空电子显示器件（CRT）可靠性评价方法的应用研究 |
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| 引用本文： | 苏振华,吴伯祥.真空电子显示器件（CRT）可靠性评价方法的应用研究[J].电子产品可靠性与环境试验,1999(2):2-8. |
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| 作者姓名： | 苏振华 吴伯祥 |
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| 作者单位： | [1]电子部五所 [2]中国华东电子管厂 |
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| 摘 要： | 本文首次采用真空电子显示器件（ＣＲＴ）在各个生产工艺及使用主要原材料的可靠性数据，根据这类器件的失效模式和可靠性理论，运用数理统计、多元回归的分析方法，得出评价此类器件固有可靠性的数学模型，找出影响ＣＲＴ基本失效率与排气、阴极、电子枪等三个关键变量之间关系的结论，并对表征ＣＲＴ可靠性水平的数学模型和模型验证进行讨论。这是目前对真空电子器件只能用常规寿命试验才能进行可靠性评价之外的另一途径的尝试和探
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| 关 键 词： | 失效率模型 常规寿命试验 CRT 真空电子器件 |
Application Investigation in the Reliability Evaluation Method of Vacuum Electron Display devices(CRT) |
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| Su Zhenhua Lin Jiang.Application Investigation in the Reliability Evaluation Method of Vacuum Electron Display devices(CRT)[J].Electronic Product Reliability and Environmental Testing,1999(2):2-8. |
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| Authors: | Su Zhenhua Lin Jiang |
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| Abstract: | This paper first used the reliability data on vacuum electron display devices(CRT) in each production process and on using major original material.Based on this Kind of devices' failure modes and reliability theory,utilizing the mathematical statistics and the multiple regression analysis method,We have derived the mathematical model for basic faulure rate evaluating this kind of devices' inherent reliability level,found CRT's basic failuire rate and the Conclusion related to 3 Key Variables exhaust cathode electron gun,etc,discussed the mathematical model characterizing CRT's reliability level and the model verification.This is an attempt of an inquisition at evaluating the vaccum devices' reliability level using another method instead of regular life testing method. |
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| Keywords: | failure rate model regular life test mathematical statistics multiple regression Analysis |
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