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The effect of fast secondary electrons on x-ray microanalysis in the scanning electron microscope. |
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| Authors: | R Gauvin P Hovington D Drouin |
| Affiliation: | Département de génie mécanique, Université de Sherbrooke, Québec, Canada. |
| Abstract: | |
| Keywords: | Monte Carlo primary electrons fast secondary electrons spatial resolution x-ray microanalysis |