| 基于图像传感器的电子元件外形缺陷检测系统 |
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| 引用本文： | 魏泽鼎,李志阔.基于图像传感器的电子元件外形缺陷检测系统[J].仪表技术与传感器,2011(6). |
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| 作者姓名： | 魏泽鼎 李志阔 |
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| 作者单位： | 河北科技大学机械电子工程学院,河北,石家庄,050018 |
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| 摘 要： | 针对目前人工检测电子元件外形缺陷的不足,研究了图像处理技术,并以晶振为例,设计了基于图像传感器的电子元件外形检测系统.首先对电子元件准确定位,由CMOS图像传感器采集元件外形的图像信息,并采用全局阈值分割法,用硬件完成图像的二值化处理.单片机将得到的二值化数据逐行扫描,并进行分析与比较,以判断该元件是否存在缺陷.实验表明该方法的检测精度可达到±0.039 mm,满足测量的需求,可解决人工检测的不足.
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| 关 键 词： | 晶振 缺陷检测 CMOS图像传感器 单片机 |
Research on Defect Inspection System of Electronic Components Shape Based on Image Sensor |
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| WEI Ze-ding,LI Zhi-kuo.Research on Defect Inspection System of Electronic Components Shape Based on Image Sensor[J].Instrument Technique and Sensor,2011(6). |
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| Authors: | WEI Ze-ding LI Zhi-kuo |
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| Affiliation: | WEI Ze-ding,LI Zhi-kuo(College of Electric and Mechanical Engineering,Hebei University of Science andTechnology,Shijiazhuang 050018,China) |
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| Abstract: | A defect inspection system of electronic components shape based on image sensor was designed for the shortcomings of manual inspection,and the oscillator was used as an example.The electronic component was positioned accuratly,its image information was collected by CMOS image sensor.The image was binarization processed by hardware in threshold segmentation mathod.MCU scanned the binary data,then analyzed and compared the data to determine whether the component was defective.The experiment results show that ... |
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| Keywords: | oscillator defect inspection CMOS image sensor MCU |
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