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Properties of Hopfield model with the zero-order synaptic decay |
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| Authors: | Ryota Miyata Toru Aonishi Jun Tsuzurugi Koji Kurata |
| Affiliation: | 1. Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama, Kanagawa, 226-8502, Japan 2. Faculty of Engineering, Okayama University of Science, 1-1 Ridai-cho, Kita-ku, Okayama, Okayama, 700-0005, Japan 3. Faculty of Engineering, University of the Ryukyus, 1 Senbaru, Nishihara-cho, Nakagami-gun, Okinawa, 903-0213, Japan |
| Abstract: | In this paper, we investigate the effect of synaptogenesis on memories in the brain, using the abstract-associative memory model, Hopfield model with the zero-order synaptic decay. Using the numerical simulation, we demonstrate the possibility that synaptogenesis plays a role in maintaining recent memories embedded in the network while avoiding overloading. For the network consisting of 1000 units, it turned out that the minimum decay rate to avoid overloading is 0.02, and the optimal decay rate to maximize the storage capacity is 0.08. We also show that the average numbers of replacement synapses at each learning step corresponding to these two values are 1187 and 21024, respectively. |
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