首页 | 本学科首页   官方微博 | 高级检索  
     

发热筛查热成像系统的测温准确性分析
引用本文:冯涛,金伟其,司俊杰.发热筛查热成像系统的测温准确性分析[J].红外技术,2021,43(10):917.
作者姓名:冯涛  金伟其  司俊杰
作者单位:北京理工大学光电学院光电成像技术与系统教育部重点实验室,北京 100081;中航工业红外探测器技术航空科技重点实验室,河南洛阳 471009
基金项目:国家自然科学基金重点项目61231014教育部博士点基金优先发展项目20131101130002
摘    要:介绍了发热筛查热成像系统的发展历程和系统构成及热像仪测温的基本原理,指出热像仪的内辐射对测温准确性具有明显影响,分析了发热筛查热成像系统用黑体参考源消除内辐射影响的工作原理。介绍了发热筛查热成像系统的测温准确性评价模型及其主要参数的要求,逐项分析了这些参数与热像仪噪声、黑体参考源及使用环境等因素的关系,发现热像仪的时间低频噪声和空间低频噪声是影响测温准确性的关键因素,指出黑体参考源可以消除时间低频噪声的影响,基于外挡片的两点校正法可以消除空间低频噪声的影响,从而使发热筛查热成像系统满足人体测温准确性要求。

关 键 词:发热筛查热成像系统  内辐射  测温准确性  时间噪声  空间噪声
收稿时间:2021-08-19

Analysis of Temperature Measurement Accuracy in Fever-Screening Thermograph
Affiliation:1.School of Optoelectronics, Beijing Institute of Technology, Key Laboratory of Photoelectronic Imaging Technology and System, Ministry of Education of China, Beijing 100081, China2.Aviation Key Laboratory of Science and Technology on Infrared Detector, Luoyang 471009, China
Abstract:The development and system composition of a fever-screening thermograph and the basic principle of a thermal imager's temperature measurement are introduced. It is observed that the thermal imager's internal radiation clearly influences the accuracy of the temperature measurement. This paper introduces an evaluation model for the temperature measurement accuracy of a fever-screening thermograph and its main parameters. By analyzing the relationship between these parameters and the thermal imager noise, the blackbody reference source, and the environment, the temporal and spatial low-frequency noise of the thermal imager are found to be the key factors affecting the accuracy of the temperature measurement. Moreover, the influence of temporal low-frequency noise can be eliminated using a blackbody reference source, and the influence of spatial low-frequency noise can be eliminated using the two-point correction method based on an external shutter. Thus, the fever-screening thermograph can meet the accuracy requirements of human body temperature measurement.
Keywords:
本文献已被 万方数据 等数据库收录!
点击此处可从《红外技术》浏览原始摘要信息
点击此处可从《红外技术》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号