首页 | 本学科首页   官方微博 | 高级检索  
     


A method for measuring single-crystal elastic moduli using high-energy X-ray diffraction and a crystal-based finite element model
Authors:C Efstathiou  DE Boyce  J-S Park  U Lienert  PR Dawson  MP Miller
Affiliation:Cornell University, Mechanical and Aerospace Engineering, 194 Rhodes Hall, Ithaca, NY 14853, USA
Abstract:This paper presents a method – based on high-energy synchrotron X-ray diffraction data and a crystal-based finite element simulation formulation – for understanding grain scale deformation behavior within a polycrystalline aggregate. We illustrate this method by using it to determine the single-crystal elastic moduli of β21s, a body-centered cubic titanium alloy. We employed a polycrystalline sample. Using in situ loading and high-energy X-rays at the Advanced Photon Source beamline 1-ID-C, we measured components of the lattice strain tensor from four individual grains embedded within a polycrystalline specimen. We implemented an optimization routine that minimized the difference between the experiment and simulation lattice strains. Sensitivity coefficients needed in the optimization routine are generated numerically using the finite element model. The elastic moduli that we computed for the β21s are C11 = 110 GPa, C12 = 74 GPa and C44 = 89 GPa. The resulting Zener anisotropic ratio is A = 5.
Keywords:
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号