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| PBGA封装焊点寿命影响因素的有限元分析 | |
| 引用本文： | 陈颖,康锐. PBGA封装焊点寿命影响因素的有限元分析[J]. 半导体技术, 2008, 33(7): 563-566 |
| 作者姓名： | 陈颖 康锐 |
| 作者单位： | 北京航空航天大学,可靠性工程研究所,北京100083;北京航空航天大学,可靠性工程研究所,北京100083 |
| 基金项目： | 中国博士后基金资助项目 |
| 摘 要： | 为明确PBGA焊点设计及环境温度参数对其可靠性影响,利用有限元软件ANSYS分析了温度循环、焊点材料、焊点高度与直径、PCB板的厚度、刚度、热膨胀系数(CTE)对焊点寿命的影响.焊点采用了Anand本构关系描述,寿命预测采用Darveaux模型.研究结果表明,温度循环的范围变大焊点寿命变短,保温时间缩短能增加焊点寿命;经过优化的焊球,寿命会增加;PCB板越厚,焊点寿命越短;PCB板的杨氏模量越大,焊点寿命越长. |
| 关 键 词： | 塑封球栅阵列封装 焊点 寿命 影响因素 有限元 |
| 文章编号： | 1003-353X(2008)07-0563-04 |
| 修稿时间： | 2008-03-14 |
Study on Lifetime Impact Factors of Solder Joint in PBGA Packaging |
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| Chen Ying,Kang Rui. Study on Lifetime Impact Factors of Solder Joint in PBGA Packaging[J]. Semiconductor Technology, 2008, 33(7): 563-566 | |
| Authors: | Chen Ying Kang Rui |
| Affiliation: | Chen Ying,Kang Rui (Institute of Reliability Engineering,Beihang University,Beijing 100083,China) |
| Abstract: | In order to clarify the impact of design and environment temperature on PBGA solder joint reliability,effect of temperature,solder material,height,diameter and gap of solder joint,thick,elastic module and CTE of PCB on solder joint lifetime were analyzed by FEA software ANSYS.Anand constitutive relation,Darveaux lifetime estimation model were utilized in the analysis.The results show that increase of the temperature scope,lifetime of solder joint will decrease.Increase dwell times will improved solder joint... |
| Keywords: | PBGA packaging solder joint lifetime impact factors FEA |
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