| 多目标多约束的集成电路统计优化策略 |
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| 引用本文： | 杨华中,王志华.多目标多约束的集成电路统计优化策略[J].微电子学,1992,22(1):36-39. |
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| 作者姓名： | 杨华中 王志华 |
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| 作者单位： | 清华大学电子工程系,清华大学电子工程系,清华大学电子工程系,清华大学电子工程系 北京 100084,北京 100084,北京 100084,北京 100084 |
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| 摘 要： | 对于集成电路设计、生产过程中的多目标、多约束统计优化问题,本文提出了“合格率足够高”的优化宗旨,并从概率论的基本原理出发,结合集成电路的特点,导出了一种合格率的近似表述方法,提出的变权重Monte Carlo法编程简便,效率高。采用这些优化策略设计的集成电路合格率优化系统取得了比较好的结果。
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| 关 键 词： | 集成电路 统计优化 合格率 CAD |
A Multi-Object and Multi-Constraint IC Statistical Optimization Strategy |
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| Yang Huazhong,Wang Zhihua,Liu Runsheng and Fan Congzhi Dept. Electronic Engineering,Tsinghua University,Beijing.A Multi-Object and Multi-Constraint IC Statistical Optimization Strategy[J].Microelectronics,1992,22(1):36-39. |
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| Authors: | Yang Huazhong Wang Zhihua Liu Runsheng and Fan Congzhi Dept Electronic Engineering Tsinghua University Beijing |
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| Affiliation: | Yang Huazhong,Wang Zhihua,Liu Runsheng and Fan Congzhi Dept. Electronic Engineering,Tsinghua University,100084,Beijing |
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| Abstract: | For the multiobject and multiconstraint statistical optimization in IC design and production, an optimization object of "yield high enough" is proposed. From the basic principle of probability,combined with IC characteristics,an approximation expression of yields has been derivied. A changed-wei-ght Monte Carlo method is presented, which is easy to program and highly efficient. Good results have been obtained by the IC yield optimization system designed with the optimization strategy. |
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| Keywords: | IC statistical optimization IC yield IC CAD |
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