Ba3ZnTa2−xNbxO9 and Ba3MgTa2−xNbxO9 (0≤x≤1): synthesis, structure and dielectric properties |
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Authors: | M ThirumalI.N Jawahar K.P SurendiranP Mohanan A.K Ganguli |
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Affiliation: | a Department of Chemistry, Indian Institute of Technology, Hauz Khas, New Delhi 110016, India b Regional Research Laboratory, Thiruvananthapuram, Kerala 695019, India c Department of Electronics, Cochin University of Science and Technology, Cochin 682022, Kerala, India |
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Abstract: | ![]() Oxides belonging to the families Ba3ZnTa2−xNbxO9 and Ba3MgTa2−xNbxO9 were synthesized by the solid state reaction route. Sintering temperatures of 1300°C led to oxides with disordered (cubic) perovskite structure. However, on sintering at 1425°C hexagonally ordered structures were obtained for Ba3MgTa2−xNbxO9 over the entire range (0≤x≤1) of composition, while for Ba3ZnTa2−xNbxO9 the ordered structure exists in a limited range (0≤x≤0.5). The dielectric constant is close to 30 for the Ba3ZnTa2−xNbxO9 family of oxides while the Mg analogues have lower dielectric constant of ∼18 in the range 50 Hz to 500 kHz. At microwave frequencies (5-7 GHz) dielectric constant increases with increase in niobium concentration (22-26) for Ba3ZnTa2−xNbxO9; for Ba3MgTa2−xNbxO9 it varies between 12 and 14. The “Zn” compounds have much higher quality factors and lower temperature coefficient of resonant frequency compared to the “Mg” analogues. |
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Keywords: | A. Oxides B. Chemical synthesis C. X-ray diffraction D. Dielectric properties |
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