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设备校准用VXI测试系统的设计
引用本文:何敏,刘辉,张超英,赵锴.设备校准用VXI测试系统的设计[J].国外电子测量技术,2006,25(7):37-39.
作者姓名:何敏  刘辉  张超英  赵锴
作者单位:1. 第二炮兵工程学院,西安,710025
2. 第二炮兵装备研究院,北京,100085
3. 解放军96630部队,北京,100085
摘    要:基于VXI总线技术的设备的测试系统能够显著提高测试精度和速度,改善测试性能.文中分析该系统研制与设计过程中面临的通用性、动态测试、一体化设计、系统匹配与抗干扰、故障诊断与故障定位等关键技术及其解决途径.

关 键 词:VXI总线  测试系统  关键技术

Design of VXI bus test system for equipment calibration
He Min,Liu Hui,Zhang Chaoying,Zhao Kai.Design of VXI bus test system for equipment calibration[J].Foreign Electronic Measurement Technology,2006,25(7):37-39.
Authors:He Min  Liu Hui  Zhang Chaoying  Zhao Kai
Abstract:The equipment test system based on VXI bus can significantly improve test precision, speed and performance. With the project design of VXI bus based basic model test system for certain equipment, this paper mainly discusses key technology and solutions to this system, which inelude universal usage, dynamic test, integrative design, system matching, anti-jamming, fault di agnosis and orientation.
Keywords:VXI bus  test system  key technology  
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