| 嵌入式系统的存储测试技术及无线传输应用 |
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| 引用本文： | 孙婷婷,马铁华,沈大伟.嵌入式系统的存储测试技术及无线传输应用[J].单片机与嵌入式系统应用,2011,11(1):27-29. |
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| 作者姓名： | 孙婷婷 马铁华 沈大伟 |
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| 作者单位： | 中北大学,仪器科学与动态测试教育部重点实验室,太原,030051 |
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| 摘 要： | 存储测试技术是在特殊环境下记录运动物体参数的最有效的手段.本文介绍了基于ARM7 LPC21xx开发存储测试系统的方法.Philips公司16/32位微控制器LPC21xx是基于支持实时仿真和嵌入式跟踪的16/32位ARM7TDMI-S CPU的微控制器,它具有掉电和空闲两种节电模式,可用电池供电并且长期工作.利用微控...
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| 关 键 词： | 嵌入式系统 ARM7 SPI nRF24L01 低功耗 |
Usage of Storage Testing Techniques Based on Embedded Systems and Wireless Transmission |
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| Sun Tingting,Ma Tiehua,Shen Dawei.Usage of Storage Testing Techniques Based on Embedded Systems and Wireless Transmission[J].Microcontrollers & Embedded Systems,2011,11(1):27-29. |
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| Authors: | Sun Tingting Ma Tiehua Shen Dawei |
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| Affiliation: | (Key Laboratory of Instrumentation Science ＆ Dynamic Measurement Ministry of Education, North University of China, Taiyuan 030051 ,China) |
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| Abstract: | Memory test technology is the most effective means to record the parameters of moving objects under special circumstances. This paper introduces the development method of storage test systems based on ARM7 LPC21xx. Philips 16/32-bit LPC21xx microcontroller is a 16/32 bit ARM7TDMI -S CPU microcontroller based on real time emulation and embedded trace. It has two power-saving modes which are power-down and idle, and can be battery powered in long-term work. The test system samples with 10 bit ADC in the microcontroller, and communicates with nRF24L01 using SPI. |
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| Keywords: | ARM7 SPI nRF24L01 |
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