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High-sensitive SPR sensing with Indium Nitride as a dielectric overlay of optical fibers
Authors:Óscar EstebanAuthor Vitae  Fernando B NaranjoAuthor VitaeNatalia Díaz-HerreraAuthor Vitae  Sirona Valdueza-FelipAuthor VitaeMaría-Cruz NavarreteAuthor Vitae  Agustín González-CanoAuthor Vitae
Affiliation:a Departamento de Electrónica, Universidad de Alcalá, Escuela Politécnica, 28871 Alcalá de Henares, Madrid, Spain
b Sección Departamental de Óptica, Escuela Universitaria de Óptica, Universidad Complutense de Madrid, Arcos de Jalón 118, 28037 Madrid, Spain
c Departamento de Óptica, Facultad de Ciencias Físicas, Universidad Complutense de Madrid, Ciudad Universitaria, 28040 Madrid, Spain
Abstract:In this work, an Indium Nitride (InN) dielectric overlay has been used to develop a surface plasmon resonance optical fiber sensor. Although InN is a very promising material in electronics industry, this is the first time that this kind of material is used for optical sensing. The obtained results show an improvement of the reliability and long term stability with respect to previous devices made with the same technology. More remarkably, the sensitivity increases up to 11,800 nm/RIU in the range of outer refractive indices between 1.415 and 1.429, the highest sensitivity achieved with this kind of devices. Therefore, a novel application of the InN to optical fiber sensors is demonstrated. The use of this material would be of great interest to produce new SPR-based devices for chemical and biological sensing.
Keywords:Tapered optical fibers  Surface Plasmon resonance  Indium Nitride
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