| 锦葵科植物花粉壁的透射电镜观察 |
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| 引用本文： | 孙京田,谢英渤.锦葵科植物花粉壁的透射电镜观察[J].电子显微学报,1993,12(3):213-217. |
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| 作者姓名： | 孙京田 谢英渤 |
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| 作者单位： | 山东师范大学测试中心，山东师范大学测试中心，山东师范大学测试中心 济南 250014，济南 250014，济南 250014 |
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| 摘 要： | 本文报道了运用超薄切片法对锦葵科(Malvaceae)七种植物花粉外壁进行透射电镜观察的结果。花粉外壁一般具有两个不同电子密度的层次,电子密度低的是外壁内层,电子密度高、具有结构的部分是外壁外层;内壁内层为无分化结构的板状层。外壁较厚,由外壁内层、柱状层和覆盖层组成。但七种花粉壁的微结构不同。本工作结果表明,运用超薄切片法可以在透射电镜下观察花粉壁的层次、结构、纹饰和萌发孔,也可以看出,不同属种花粉壁的构造是不同的。
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| 关 键 词： | 锦葵科 花粉 外壁 花粉壁 |
TEM observation of the pollen exine of Malvaceae plants |
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| Sun Jingtian,Xie Yingbo,Wang Shuyun.TEM observation of the pollen exine of Malvaceae plants[J].Journal of Chinese Electron Microscopy Society,1993,12(3):213-217. |
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| Authors: | Sun Jingtian Xie Yingbo Wang Shuyun |
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| Affiliation: | Analyusis and Testing Centre of Shandong Normal University |
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| Abstract: | In this paper, the exine ultrastructure of seven kinds of pollen grain of malvaceae, was examined by ultra-thin sectioning technique in Transmission Electron Microscope. The results showed that layers of exine, struc-ture of exine, pentreme of exine and aperture can be examined with Transmission EIectron Microscopy. The ex-ine ultrastructure of various pollen grains was different. |
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| Keywords: | Malvaceae pollen exine Transmission Electron Microscope |
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