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Resistivity dependence of minority carrier lifetime and cell performance in p-type dendritic web silicon ribbon
Authors:Mohamed Hilali  Abasifreke Ebong  Ajeet Rohatgi  Daniel L Meier
Affiliation:

a School of Electrical and Computer Engineering, Georgia Institute of Technology, 777 Atlantic Drive, GA 30332-0250, USA

b Ebara Solar Inc., 1801 Route 51, Jefferson Hills, PA 15025, USA

Abstract:This study shows that the bulk lifetime in 95 μm thick p-type dendritic web silicon solar cells is a strong function of bulk resistivity. The higher the resistivity, the greater the bulk lifetime. This behavior is explained on the basis of dopant–defect interaction, which increases the lifetime limiting trap concentration with the addition of dopant atoms. Model calculations show that in the absence of doping dependence of bulk lifetime (τ), not, vert, similar2 Ω cm web should give the best cell efficiency for bulk lifetimes below 30 μs. However, strong doping dependence of bulk lifetime in p-web cells shifts the optimum resistivity from 2 to 15 Ω cm. Bulk lifetime in the as-grown web material was found to be less than 1 μs for all the resistivities. After the cell processing which involves phosphorus gettering, aluminum gettering, and SiN induced hydrogen passivation of defects, the bulk lifetime increased to 6.68, 11, 31 and 68.9 μs in 0.62, 1.37, 6.45 and 15 Ω cm p-type web material, respectively. Therefore, cell process induced recovery of lifetime in web is doping dependent, which favors high resistivity. Solar cells fabricated on 95 μm thick web silicon by a manufacturable process involving screen-printing and belt-line processing gave 14.5% efficient 4 cm2 cells on 15 Ω cm resistivity. This represents a record efficiency for such a thin manufacturable screen-printed cell on a low-cost PV grade Si ribbon that requires no wafering or etching.
Keywords:Silicon  Solar cells  Dopant  Defects  Carrier lifetime
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