Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate-lead titanate single crystal |
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| Authors: | Chun-I ChuangVera Marinova Shiuan-Huei LinYu-Faye Chao |
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| Affiliation: | a Department of Photonics and Institute of Electro-Optical Engineering, National Chiao Tung University, 1001 University Rd., Hsinchu, Taiwan 300, ROCb Central Laboratory of Optical Storage and Processing of Information, Bulgarian Academy of Sciences, P.O. Box 95, 1113 Sofia, Bulgariac Department of Electrophysics, National Chiao Tung University, 1001 University Rd., Hsinchu, Taiwan 300, ROC |
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| Abstract: | Phase-modulated ellipsometry was applied to measure changes in the refractive index of pure and ruthenium (Ru)-doped 0.9Pb (Zn1/3Nb2/3)O3 (PZN)-0.1PbTiO3 (PT) during the heating process in real time. Both samples were heated from room temperature to 200 °C in a thermally insulated chamber. In both samples, the phase transitions were observed to change from tetragonal to cubic. The temperature region at which the phase transition (Curie region) of Ru-doped 0.9PZN-0.1PT occurred not only broadened but also shifted to a lower temperature. The refractive indices were extremely stable in this region, meaning that Ru-doped 0.9PZN-0.1PT is a more favorable medium for the fabrication of optical memories. |
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| Keywords: | Refractive index Perovskite Curie region Ellipsometry |
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