Aberration measurement in confocal microscopy: Phase retrieval from a single intensity measurement |
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| Authors: | H. Zhou C. J. R. Sheppard |
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| Affiliation: | 1. Department of Physical Optics , School of Physics A 28, University of Sydney , New South Wales, 2006, Australia;2. Department of Physical Optics , School of Physics A 28, University of Sydney , New South Wales, 2006, Australia;3. Australian Key Centre for Microscopy and Microanalysis, University of Sydney , New South Wales, 2006, Australia |
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| Abstract: | Abstract A simplified method for aberration measurement in confocal microscopy is proposed. The method is based on analysis of the Fourier spectrum of the confocal interference axial response. With this method, both the complex pupil function and the complex defocus signal can be recovered from only a single measurement, and no electro-optic phase modulator is needed. This method has been demonstrated both theoretically and experimentally. |
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