Simulation in electrochemistry using the finite element method part 2: scanning electrochemical microscopy

The previously introduced adaptive finite element (AFE) algorithm for use in electrochemistry is applied to the simulation of selected multidimensional problems: steady state simulation, chronoamperometric simulation, cyclic voltammetry at microelectrodes, and simulation of arbitrarily shaped scanning electrochemical microscope (SECM) tips. It is shown that the algorithm is suitable for this kind of problems and can be easily extended to the simulation of many types of electrochemical experiments.