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| 组合逻辑电路故障诊断研究 | |
| 引用本文： | 张静 陈云忠. 组合逻辑电路故障诊断研究[J]. 沈阳理工大学学报, 1997, 16(3): 71-74 |
| 作者姓名： | 张静 陈云忠 |
| 作者单位： | 辽宁工程技术大学，中国人民解放军９５７８工厂 |
| 摘 要： | 论述了一种把各种逻辑电路转化为由与非门组成的电路，然后转变为双色图并直接获得完整的测试矢量或故障表的方法，该法可定位全部单故障及大部分多故障． |
| 关 键 词： | 组合逻辑电路，故障诊断，树网 |
Research on Combination Logic Circuit Fault Diagnosis |
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| Zhang Jing Li Jisheng Chen Yunzhong. Research on Combination Logic Circuit Fault Diagnosis[J]. Transactions of Shenyang Ligong University, 1997, 16(3): 71-74 | |
| Authors: | Zhang Jing Li Jisheng Chen Yunzhong |
| Abstract: | A method that converts all logic circuits into NAND gate,then into two color graph is described,which can directly abtain the complete test vector or fault table.Furthermore the method can locate all single faults and most of multiple faults. [ |
| Keywords: | combinational logic circuit fault diagnosis tree net. |
| 本文献已被 CNKI 维普 等数据库收录！ | |