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On-Chip Evaluation of Oscillation-Based-Test Output Signals for Switched-Capacitor Circuits |
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| Authors: | Diego Vázquez Gloria Huertas Gildas Leger Eduardo Peralías Adoración Rueda José Luis Huertas |
| Affiliation: | (1) Instituto de Microelectrónica de Sevilla (IMSE-CNM), Universidad de Sevilla, Edificio CICA, c/Tarfia s/n, 41012 Sevilla, Spain |
| Abstract: | This work presents a simple and low-cost method for on-chip evaluation of test signals coming from the application of the Oscillation-Based-Test (OBT) technique. This method extracts the main test signal features (amplitude, frequency and DC level) in the digital domain requiring just a very simple and robust circuitry. Experimental results obtained from an integrated chip demonstrate the feasibility of the approach. |
| Keywords: | oscillation-based-test (OBT) analog testing oversampling modulators on-chip evaluation of test signals test interpretation |
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