基于测量的时延故障诊断

与时延测试相比，时延故障诊断需要更精确的故障模型。该文提出了采用精确测量的时延模型和时延故障模型。在这种模型下，利用电路通路图的原理，得到与被测电路的拓扑结构有关的一个精简测试集。测试集的大小与电路的大小保持线性增长关系；其中的每一个测试对应于一条通路的单跳变敏化向量，将测试集中的单跳变敏化向量送入被测电路，可以用测试仪测量相应通路的延时，得到电路关于此测试集的时延故障症候。该文对时延故障症候提供

MEASUREMENT-BASED DELAY FAULT DIAGNOSIS

Delay fault diagnosis requires more accurate fault models than delay fault detection. This paper presents a delay model and a delay fault model using the method of accurate measurement. A reduced test set is obtained by using the principle of circuit path graph, which is coherent with the topological structure of the circuit under test. The size of the test set is linear to the size of the circuit under test, while the number of paths is exponential. Each test sensitizes a path under the concept of single transition sensitization to enable the measurement of the path delay. Therefore, a delay fault symptom of the circuit respecting to the test set is obtained. This paper presents a diagnosis approach on a delay fault syndrome for transition delay fault on a single line. This approach can locate the fault to a very small set of lines, even to a single line. The experimental results show that the average rate of successful diagnoses is 93.55%, and the average diagnosis resolution is 1.61. Thus, this approach is efficient. The paper also explains that under the concept of single transition sensitization, why a few diagnoses fail. For the failed diagnosis, the paper shows that the diagnosis result is equivalent to the actual fault.