Pseudomorphic high electron mobility transistor monolithic microwave integrated circuits reliability study

Accelerated high temperature RF life testing was used to investigate the reliability of two-stage GaAs monolithic microwave integrated circuit (MMIC) power amplifiers based on 0.25 μm pseudomorphic high electron mobility transistor technology. Life testing was performed at elevated baseplate temperatures with MMICs operating at typical d.c. bias conditions and large signal RF drive levels of two dB compression. The resulting failure distribution was log normal and the estimated median life time extrapolated to a channel temperature of 140°C was 2.3×10⁶ h with an activation energy of 1.1 eV.