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| 半导体器件可靠性试验的计算机控制 | |
| 引用本文： | 郭伟玲 程尧海. 半导体器件可靠性试验的计算机控制[J]. 微电子学, 1997, 27(2): 138-141 |
| 作者姓名： | 郭伟玲 程尧海 |
| 作者单位： | 北京工业大学电子工程系 |
| 摘 要： | 介绍了半导体器件可靠性试验自动控制过程，详细探讨了系统控制原理和软件设计思想，给出了主要程序框图及测试实例，说明了该自动控制测试方法的可行性和正确性。 |
| 关 键 词： | 半导体器件 可靠性 计算机控制 |
Computer Controlled Reliability Test of Semiconductor Devices |
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| GUO Wei Ling,CHENG Yao Hai,LI Zhi Guo,LI Yu and SUN Ying Hua Dept. of Electro. Engineer.,Beijing Polytechnic Univ.,Beijing. Computer Controlled Reliability Test of Semiconductor Devices[J]. Microelectronics, 1997, 27(2): 138-141 | |
| Authors: | GUO Wei Ling CHENG Yao Hai LI Zhi Guo LI Yu SUN Ying Hua Dept. of Electro. Engineer. Beijing Polytechnic Univ. Beijing |
| Affiliation: | GUO Wei Ling,CHENG Yao Hai,LI Zhi Guo,LI Yu and SUN Ying Hua Dept. of Electro. Engineer.,Beijing Polytechnic Univ.,Beijing 100022 |
| Abstract: | A reliability test of semiconductor devices has been conducted by using computer control. The process of automatic control is described. The operation of the control system and considerations on software engineering are discussed in detail. The program flow chart and test results are given. |
| Keywords: | Semiconductor device Reliability Computer control |
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