Enhanced Plasma Wave Detection of Terahertz Radiation Using Multiple High Electron-Mobility Transistors Connected in Series |
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Authors: | Elkhatib T. A. Kachorovskii V. Y. Stillman W. J. Veksler D. B. Salama K. N. Zhang X.-C. Shur M. S. |
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Affiliation: | Department of Electrical, Computer, and System Engineering, Rensselaer Polytechnic Institute, NY, USA; |
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Abstract: | ![]() We report on enhanced room-temperature detection of terahertz radiation by several connected field-effect transistors. For this enhanced nonresonant detection, we have designed, fabricated, and tested plasmonic structures consisting of multiple InGaAs/GaAs pseudomorphic high electron-mobility transistors connected in series. Results show a 1.63-THz response that is directly proportional to the number of detecting transistors biased by a direct drain current at the same gate-to-source bias voltages. The responsivity in the saturation regime was found to be 170 V/W with the noise equivalent power in the range of ${hbox{10}}^{-7}~{hbox{W/Hz}}^{0.5}$ . The experimental data are in agreement with the detection mechanism based on the rectification of overdamped plasma waves excited by terahertz radiation in the transistor channel. |
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