| CMOS像传感器光饱和效应研究 |
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| 引用本文： | 常国龙. CMOS像传感器光饱和效应研究[J]. 福建分析测试, 2011, 20(3): 60-62 |
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| 作者姓名： | 常国龙 |
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| 作者单位： | 厦门市产品质量监督检验院; |
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| 基金项目： | “十一五”国家科技支撑计划重点项目资助,项目编号:2009BAK58B03 |
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| 摘 要： | 图像传感器在光学测量中具有重要作用,随着光源光强的提高,图像传感器处于饱和光强的情况越来越多.因此本文通过采用激光辐照CMOS像传感器的方法,研究了CMOS像传感器的饱和效应,明显观察到高光强使得图像灰度由亮变暗现象.该研究可以为高光强测试以及相机设计及后续图像处理提供参考.
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| 关 键 词： | CMOS像传感器 光饱和 成像 激光 |
Study on the Light Saturation Effect of the CMOS Image Sensor |
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| Chang Guo-long. Study on the Light Saturation Effect of the CMOS Image Sensor[J]. Fujian Anal Ysis & Testing, 2011, 20(3): 60-62 |
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| Authors: | Chang Guo-long |
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| Affiliation: | Chang Guo-long(Xiamen Products Quality Inspection Institute,Xiamen,Fujian361004,China) |
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| Abstract: | Image sensor is very important for optical measurement,as the power of the light source increasing,image sensor will more frequently work in saturated light.This paper studied the saturation effect of the CMOS image sensor by using laser irradiated the CMOS image sensor.High power light could make the pixels dark and the diffusion of charges could make the pixels saturated.This research could give a reference for the design of camera and the image processing |
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| Keywords: | CMOS image sensor light saturation imaging laser |
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