Reliability studies of gain-guided 0.85 μm GaAs/AlGaAs quantumwell surface emitting lasers |
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Authors: | Wu C.C. Tai K. Huang T.C. Huang K.F. |
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Affiliation: | Inst. of Electro-Opt. Eng., Chiao Tung Univ., Hsinchu; |
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Abstract: | A reliability study of gain-guided 0.85 μm GaAs/AlGaAs quantum well surface emitting lasers is reported for the first time. 32 lasers were randomly selected to operate at 25 or 50 C with bias currents up to 15 mA, about 4 times the threshold values. The power outputs of the 32 lasers showed no noticeable degradation after 2000-3000 hours of operation |
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