ED-XRF法快速测定轻质石油产品中微量有害元素

利用能量色散X射线荧光光谱仪建立了轻质油品中有害杂质硅、磷、硫、氯4种元素含量的快速测定方法。对X射线光源靶材、测定参数、基质效应以及测试过程的影响因素进行考察及优化，并采用标准加入法对测定方法的有效性进行验证。结果表明：采用所建立的方法测定硅、磷、硫、氯含量的结果均具有良好的线性关系，R²大于0.999；硅、磷、硫、氯最低检出限分别为2.0，0.8，0.5，0.2 μg/g；加标回收率在95.1%～105.0%之间；相对标准偏差均小于6%。该方法可以用于轻质油品中有害杂质元素的快速测定与筛查。

RAPID DETERMINATION OF TRACE CONTAMINANTS IN LIGHT PETROLEUM PRODUCTS BY ED-XRF

A rapid accurate method for determination of trace pollutants in light petroleum products, including silicon, phosphorus, sulfur and chlorine-containing compounds, was established by using ED-XRF. The target material of X-ray source, matrix effect and the interfering factors for the measurement process were investigated and optimized. The validation was carried out by the standard addition. The results showed that the established method had a good linear relationship with silicon, phosphorus, sulfur, chlorine content with R²more than 0.999. The detection limits of silicon, phosphorus, sulfur and chlorine were 2.0, 0.8, 0.5, 0.2 μg/g, respectively. The adding standard recoveries were between 95.1%-105.0%，the relative standard deviation was less than 6.0%. It could be used for rapid determination and screening of harmful impurities in light petroleum products.