Low-frequency noise of InP/InGaAs heterojunction bipolartransistors

The equivalent base noise SI_b of InP/InGaAs heterojunction bipolar transistors (HBT's) with a circular pattern emitter is investigated experimentally at a low frequency ranging from 10-10⁵ Hz. The measured SI_b exhibits the 1/f dependence in an overall frequency range without any accompanying burst noise. Furthermore, SI_b varies as I_b^γ for the base current I_b and as d^-2 for the emitter diameter d, where the value of γ ranges from 1.62-1.72 depending on d of HBT's used. The 1/f noise model, which rigorously deals with the recombination current at the base surface I_bs as a function of I_b as well as of d is proposed. Applying our noise model to the dependence of SI_b on I_b, as well as on d, reveals that even though γ is less than two, the origin of SI_b is due to the recombination of electrons at the exposed base surface near the emitter edges. On the basis of theoretical considerations for the diffusion length of electrons and traps at the base surface, the Hooge parameter α_H for the noise due to the base surface recombination is deduced to be in the order of 10 ^-2 for the first time