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| 半导体物理 | |
| 摘 要： | Y2000-62067-106 0009248用传输电子显微术确定量子点轮廓=Transmissionelectron microscopy determination of quantum dot profile[会,英]/Liao,X.Z.& Zou,J.//1998 IEEE Interna-tional Conference on Optoelectronic and MicroelectronicMaterials and Devices.—106～108(EC) |
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