| 功能覆盖率驱动的自适应遗传算法验证技术 |
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| 引用本文： | 吴剑浪,石景恺,康怀祺.功能覆盖率驱动的自适应遗传算法验证技术[J].微电子学,2015,45(4):529-532. |
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| 作者姓名： | 吴剑浪 石景恺 康怀祺 |
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| 作者单位： | 电子科技大学 电子科学技术研究院, 成都 611731,电子科技大学 电子科学技术研究院, 成都 611731,电子科技大学 电子科学技术研究院, 成都 611731 |
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| 基金项目： | 航空科学基金资助项目(20090580013,2)；中央高校基础研究基金资助项目(ZYGX2009J092) |
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| 摘 要： | 根据不同功能测试点在芯片代码中的逻辑深度与相应测试向量覆盖到的测试点多少的关系,对不同测试点设置了相应的权重,提出一种基于自适应遗传算法的激励向量生成方法。实验结果表明,该方法能减少编写约束文件时间,较快自动搜索有针对性的测试激励,提高芯片功能验证的可靠性和仿真效率。
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| 关 键 词： | 代码逻辑深度 测试点权重 功能覆盖率 自动测试 遗传算法 |
| 收稿时间： | 2014/6/16 0:00:00 |
Adaptive Genetic Algorithm Verification Technology Driven by Functional Coverage |
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| WU Jianlang,SHI Jingkai and KANG Huaiqi.Adaptive Genetic Algorithm Verification Technology Driven by Functional Coverage[J].Microelectronics,2015,45(4):529-532. |
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| Authors: | WU Jianlang SHI Jingkai and KANG Huaiqi |
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| Affiliation: | Research Institute of Electronic Science and Technology, Univ. of Elec. Sci. and Technol of China, Chengdu 611731, P. R. China,Research Institute of Electronic Science and Technology, Univ. of Elec. Sci. and Technol of China, Chengdu 611731, P. R. China and Research Institute of Electronic Science and Technology, Univ. of Elec. Sci. and Technol of China, Chengdu 611731, P. R. China |
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| Abstract: | Different weights were appropriately set based on the relationship between the code logical depth of function test points and the test points covered by a test vector. A test vector generation method based on adaptive genetic algorithm was proposed. The experimental results showed that the method could reduce the time of writing constraint files and auto-generate a stimulation, which was more efficient and targeted. The method had improved the efficiency and reliability of the chip functional verification. |
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