电子剪切散斑中的相位分析方法

由于在电子剪切散斑干涉中被测物理量与光学位相直接相关，通过对干涉条纹的处理能够精确获取物体变形场的位相信息，运用相位分析方法即可导出物体在外力作用下的微小位移及形变。本文综述了电子剪切散斑干涉中条纹的位相测量方法，介绍了目前较为常用的几种相位分析方法的工作原理及实验方法，并讨论了各种方法在工程运用上的所具有的特点。

Phase Analysis Method Used in Electronic Speckle Shearing interferometry

Since there is direct correlation between the measuring parameter and optical phase,we could obtain the precise phase of the changeable field from interferometric fringe patterns.With phase analyzsis method we can get the micro change generated by the outside force.The phase measurement used in the fringe patterns of ESSPI are summarized here. Several common used phase analysis methods are presented in this novel.It expounds the surveying principles and limitation in practical application.