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| The domain structure and polarization retention properties of PT/PZT/PT ferroelectric thin film | |
| 作者姓名： | WANG LongHai Yu Jun ZHAO SuLing ZHENG ChaoDuan WANG YunBo & GAO JunXiong School of Electric and Information Engineering Wuhan Institute of Technology Wuhan China |
| 作者单位： | WANG LongHai1，2，Yu Jun2，ZHAO SuLing3，ZHENG ChaoDuan2，WANG YunBo2 & GAO JunXiong2 1 School of Electric and Information Engineering，Wuhan Institute of Technology，Wuhan 430073，China; 2 Department of Electronic Science and Technology，Huazhong University of Science and Technology，Wuhan 430074，China; 3 The Research & Test Center of Materials，Wuhan University of Technology，Wuhan 430070，China |
| 基金项目： | 国家自然科学基金;国家自然科学基金 |
| 摘 要： | The highly oriented perovskite-phase PT/PZT/PT ferroelectric thin film was pre- pared by sol-gel method. The domain structures and polarization retention proper- ties were investigated by scanning force microscopy. The amplitude and phase images of piezoresponse show complex various contrasts of dark, bright and gray. The complex variation of contrast in piezoresponse images results from the per- plexing orientation of grains and arrangement of domains in the ferroelectric films. The bright and dark areas in phase images correspond to top-to-bottom and bot- tom-to-top polarization oriented c-domain, respectively. The gray areas are c-domains with the polarization vector deviating from the direction normal to the film plane. The surface potential images of EFM are bright contrast, which is due to positive charges trapped on the film surface after being polarized by positive volt- age. And the brighter contrast is obtained from the higher electric field. The time-dependent surface potential images and line potential profiles show that the potential decays with time. And the decay in the region polarized by higher electric field is faster, especially at 15 min. This indicates that the polarization retention is related to the polarized electric field. Better retention properties may be obtained from a proper polarized electric field. |
| 收稿时间： | 5 April 2005 |
| 修稿时间： | 14 December 2006 |
The domain structure and polarization retention properties of PT/PZT/PT ferroelectric thin film |
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| WANG LongHai,,Yu Jun,ZHAO SuLing,ZHENG ChaoDuan,WANG YunBo & GAO JunXiong School of Electric and Information Engineering,Wuhan Institute of Technology,Wuhan ,China, .The domain structure and polarization retention properties of PT/PZT/PT ferroelectric thin film[J].Science in China(Technological Sciences),2007,50(2):190-198. | |
| Authors: | Wang LongHai Yu Jun Zhao SuLing Zheng ChaoDuan Wang YunBo Gao JunXiong |
| Affiliation: | 1. School of Electric and Information Engineering, Wuhan Institute of Technology, Wuhan 430073, China;Department of Electronic Science and Technology, Huazhong University of Science and Technology, Wuhan 430074, China 2. Department of Electronic Science and Technology, Huazhong University of Science and Technology, Wuhan 430074, China 3. The Research & Test Center of Materials, Wuhan University of Technology, Wuhan 430070, China |
| Abstract: | The highly oriented perovskite-phase PT/PZT/PT ferroelectric thin film was pre- pared by sol-gel method. The domain structures and polarization retention proper- ties were investigated by scanning force microscopy. The amplitude and phase images of piezoresponse show complex various contrasts of dark, bright and gray. The complex variation of contrast in piezoresponse images results from the per- plexing orientation of grains and arrangement of domains in the ferroelectric films. The bright and dark areas in phase images correspond to top-to-bottom and bot- tom-to-top polarization oriented c-domain, respectively. The gray areas are c-domains with the polarization vector deviating from the direction normal to the film plane. The surface potential images of EFM are bright contrast, which is due to positive charges trapped on the film surface after being polarized by positive volt- age. And the brighter contrast is obtained from the higher electric field. The time-dependent surface potential images and line potential profiles show that the potential decays with time. And the decay in the region polarized by higher electric field is faster, especially at 15 min. This indicates that the polarization retention is related to the polarized electric field. Better retention properties may be obtained from a proper polarized electric field. |
| Keywords: | ferroelectric thin film domain polarization retention scanning force microscope (SFM) |
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