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VSF:CMOS组合电路的静态功耗评估模型
引用本文:赵晓莺,佟冬,程旭.VSF:CMOS组合电路的静态功耗评估模型[J].半导体学报,2007,28(5):789-795.
作者姓名:赵晓莺  佟冬  程旭
作者单位:北京大学微处理器研究与开发中心,北京,100871;北京大学微处理器研究与开发中心,北京,100871;北京大学微处理器研究与开发中心,北京,100871
基金项目:国家高技术研究发展计划(863计划)
摘    要:为了解决利用晶体管级电路模拟分析CMOS电路静态功耗时模拟时间随电路规模增大迅速增加的问题,在分析晶体管堆叠效应对标准单元泄漏电流影响的基础上,定义了归一化堆叠系数和电路等效堆叠系数的概念,提出了基于电路有效堆叠系数的静态功耗评估模型.该模型可用于CMOS组合电路静态功耗估算和优化.实验结果表明使用该模型进行静态功耗估算时,不需要进行Hspice模拟.针对ISCAS85基准电路的静态功耗优化结果表明,利用该模型能够取得令人满意的静态功耗优化效果,优化速度大大提高.

关 键 词:归一化堆叠系数  电路有效堆叠系数  静态功耗评估模型  CMOS组合电路
文章编号:0253-4177(2007)05-0789-07
收稿时间:10/5/2006 5:13:59 PM
修稿时间:10 5 2006 12:00AM

VSF: A Leakage Power Evaluation Model for CMOS Combinational Circuits
Zhao Xiaoying,Tong Dong and Cheng Xu.VSF: A Leakage Power Evaluation Model for CMOS Combinational Circuits[J].Chinese Journal of Semiconductors,2007,28(5):789-795.
Authors:Zhao Xiaoying  Tong Dong and Cheng Xu
Affiliation:Micro-Processor Research & Development Center, Peking University, Beijing 100871, China;Micro-Processor Research & Development Center, Peking University, Beijing 100871, China;Micro-Processor Research & Development Center, Peking University, Beijing 100871, China
Abstract:Two parameters, one called the unified stacking factor (USF) and the other called the circuit virtual stacking factor (VSF), are defined based on the relationship between the transistor stacking effect and the leakage current of standard cells.A VSF-based leakage power evaluation model is then developed and used for evaluating and reducing the leakage power of CMOS combinational circuits.Experiments show that the VSF model is not needed for Hspice simulation when evaluating leakage power.For ISCAS85 benchmark circuits, satisfactory leakage power reduction can be achieved, and the optimization speed can be accelerated greatly.
Keywords:unified stacking factor  virtual stacking factor  leakage power evaluation model  CMOS combinational circuit
本文献已被 CNKI 维普 万方数据 等数据库收录!
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