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基于“魂芯一号”的雷达信号处理机边扫设计
引用本文:王凤驰,陈常青,李正东.基于“魂芯一号”的雷达信号处理机边扫设计[J].雷达科学与技术,2014,12(6):645-648.
作者姓名:王凤驰  陈常青  李正东
作者单位:中国电子科技集团公司第三十八研究所,安徽合肥,230088
摘    要:"魂芯一号"(BWDSP100)芯片是一款性能优越的高端DSP处理器,适用于雷达信号处理、电子对抗、精确制导武器、通信保障等领域。针对基于4片BWDSP100芯片和2片ALTERA公司的高端FPGA芯片设计的某雷达信号处理机,用边界扫描测试技术设计了TPS(Test Project Set),以验证BWDSP100芯片的可测试性。同时对该雷达信号处理机的DDR2、FLASH等外围芯片进行了测试有效性验证。经过验证,不仅BWDSP100芯片具有较好的可测试性设计,外围芯片的测试效果也很好,使得该雷达信号处理机有较高的故障覆盖率。

关 键 词:魂芯一号  边界扫描测试  TPS设计  信号处理机

TPS Designed for Radar Signal Processing Board Based on HunXin-1 Chip
WANG Feng-chi,CHEN Chang-qing,LI Zheng-dong.TPS Designed for Radar Signal Processing Board Based on HunXin-1 Chip[J].Radar Science and Technology,2014,12(6):645-648.
Authors:WANG Feng-chi  CHEN Chang-qing  LI Zheng-dong
Affiliation:(No. 38 Research Institute of CETC, Hefei 230088, China)
Abstract:The HunXin-1(BWDSP100)chip is a high performance IC chip.It is widely used in military field such as radar signal processing,electronic countermeasure,precision-guided weapons,communication support.We have used boundary-scan technology to design a test project set(TPS)for a radar signal process-ing board based on four BWDSP100 chips and two FPGA(ALTERA).We were supposed to verify the test-ability of BWDSP100 chip and we have found that the BWDSP100 chip has good testability.And the testabili-ty of DDR2 chips and FLASH on the signal processing board is also verified.The radar signal processing board using the BWDSP100 chip has a high fault coverage.
Keywords:HunXin-1 chip  boundary-scan test  TPS design  signal processing board
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