| 微型电子测压器校准系统的合理性论证 |
| |
| 引用本文： | 袁月华,裴东兴,张瑜.微型电子测压器校准系统的合理性论证[J].传感器世界,2011,17(7):22-25. |
| |
| 作者姓名： | 袁月华 裴东兴 张瑜 |
| |
| 作者单位： | 中北大学电子测试技术国家重点实验室 |
| |
| 摘 要： | 为确保微型电子测压器在高温、高压、高；中击的实测环境中的测试精度，微型电子测压器应用于实际测试前，都要在模拟应用环境下被校准，为了证明微型电子测压器校准系统的合理性，介绍了标准测试系统的时域静态校准，标准测试系统的动态响应特性，标准测试系统的误差要求3方面的内容。分析结果表明，使用该校准系统能保证被校准后的微型电子测压器的可靠性和测试精度，满足测试要求。
|
| 关 键 词： | 测试计量仪器 动态校准 动态响应 合理性 |
Rationality analysis of calibration system for micro electronic piezo gauge |
| |
| YUAN Yue Hua,PEI Dong Xing,ZHANG Yu.Rationality analysis of calibration system for micro electronic piezo gauge[J].Sensor World,2011,17(7):22-25. |
| |
| Authors: | YUAN Yue Hua PEI Dong Xing ZHANG Yu |
| |
| Affiliation: | 1 (1.National Key Laboratory for Electronic Measurement Technology, North University of China, Taiyuan 030051,China 2.Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051,China) |
| |
| Abstract: | To guarantee high precision of micro electronic piezo-gauge in high temperature, high pressure and high impact environments, micro electronic piezo-gauge must be calibrated in the simulation application environments before they are used in the actual measuring application. In order to prove the rationality of calibration system for micro electronic piezo gauge, The discussion in three aspects of the standard measuring system—static time-domain calibration , dynamic response characteristics and error requirements are provided. The results show that the use of this calibration system can guarantee the reliability and precision of micro electronic piezo gauge to meet the measurement requirements. |
| |
| Keywords: | |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
|
