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Hot photo-carrier and hot electron effects in p-n junctions
Authors:M. Umeno  Y. Sugito  T. Jimbo  H. Hattori  Y. Amemiya
Affiliation:Department of Electrical Engineering, Nagoya University, Nagoya 464, Japan
Abstract:
When a p-n junction of semiconductor (with bandgap energy Eg) is illuminated by light beam (with photon energy hv) in the condition of Eg>hv, such as in Ge p-n junction illuminated by CO2 laser beam, an electromotive force (emf) was induced between the terminals of the p-n junction, which indicated the opposite polarity to the ordinary photovoltaic effect like a solar cell. Such an anomalous photovoltaic phenomenon was explained by an optically excited hot carrier effect, through the following experiment with electrical excitation. Using a rod of n- or p-type Ge with a p-n junction at the surface of its center and an ohmic contact at each terminal of the rod, the same kind of phenomena was observed when electric field is applied along the length of the rod. The perpendicularly induced voltage or current had the same polarity instead of the reverse change of the applied electric field, and increases with increasing the applied field strength. The perpendicularly induced emf was caused by warm or hot carriers crossing the potential barrier of the p-n junction, which is very sensitive to the departure from thermally equilibrium velocity distribution of carriers.
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