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Circumferential higher order guided wave modes for the detection and sizing of cracks and pinholes in pipe support regions
Authors:L Satyarnarayan  J Chandrasekaran  Bruce Maxfield  Krishnan Balasubramaniam  
Affiliation:aCenter for Non-Destructive Evaluation, Department of Mechanical Engineering, Indian Institute of Technology Madras, Chennai 600 036, India
Abstract:The non-dispersive propagation of ultrasonic guided wave higher order modes cluster (HOMC) traveling along the circumferential direction in a hollow cylinder and its interaction with defects in pipe support regions is reported. These circumferential guided waves were generated in mild steel (MS) pipe specimens containing artificially created axial notches (simulating axial cracks) and pinholes (simulating pinhole-like defects) of different sizes in order to simulate conditions such as cracking and corrosion under pipe supports. The characteristics of these guided waves were also studied as a function of parameters related to how they were generated; namely, using: (a) 2.25 MHz linear phased array transducer, (b) 2.25 MHz conventional circular transducer and (c) 1 MHz conventional circular transducer. These higher frequency modes were explored for their ability to detect and size defects. Because of access limitations to the pipe support region in actual field testing, the transducer was always placed at a fixed circumferential position and moved axially along the length of the pipe. The defect position along the circumference was ascertained from the time of flight while the defect size was estimated using the amplitude data. The signals obtained for all three transducer configurations are compared for their ability to locate, detect and size the above-mentioned defects. It was shown that at these relatively higher frequencies, the guided wave modes exhibit small dispersion and have the ability to provide improved imaging of small size defects throughout the cross-section of the pipe.
Keywords:Phased array  Circumferential guided waves  Pinhole defects  Defect sizing
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