Optoelectronic Method of Noncontacting Reconstruction of the Profile of a Surface of Three Dimensional Objects of Large Dimensions

An optoelectronic method is considered for noncontacting reconstruction of the surface profile of three-dimensional objects of large dimensions. The optimal conditions for performing measurements are identified. It is shown that the proposed method, in contrast to the already known methods, does not require fine tuning of the equipment. A numerical method is given for compensating distortions caused by aberrations. A method is described for reconstructing the surface profile cell by cell which increases the accuracy of measurements.