首页 | 本学科首页   官方微博 | 高级检索  
     


Discussion on Failure Sensitive Parameters of an EED Life Performance in Storage
Authors:YAN Nan and JIANG Min-rong
Affiliation:State Key Laboratory for the Prevention and Control of Explosion Disasters, Beijing Institute of Technology, Beijing 100081, China
Abstract:An issue to distinguish sensitive parameters of storage life prior to the failure of a bridgewire electro-explosive device (EED) is studied. The degradations of bridgewire resistance, 50% firing current, ignition delay time, bridgewire molten time and powder color with the storage time were measured under a simulating accelerated life test of high-temperature and high-humidity. The most sensitive parameter suitable to evaluate the EED storage life is discussed. It is concluded that the standard deviation of resistance change is the most sensitive degradation variable, and the next is bridgewire molten time, 50% firing current and ignition delay time. The mean of resistance is an insensitive degradation parameter.
Keywords:failure analysis  electro-explosive device (EED)  accelerated life test
本文献已被 CNKI 维普 万方数据 等数据库收录!
点击此处可从《北京理工大学学报(英文版)》浏览原始摘要信息
点击此处可从《北京理工大学学报(英文版)》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号