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Performance-Aware Corner Model for Design for Manufacturing
Abstract: We present a methodology to generate performance-aware corner models (PAMs). Accuracy is improved by emphasizing electrical variation data and reconciling the process and electrical variation data. PAM supports corner ($pm sigma$ and $pm hbox{2}sigma$) simulation and Monte Carlo simulation. Furthermore, PAM supports the practice of application-specific corner cards, for example, for gain-sensitive applications.
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