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滤光片及X射线二极管响应面均匀性研究
引用本文:崔延莉,孙可煦,易荣清,黄天暄,杨家敏,丁永坤,丁耀南,曹磊峰,杨国洪,温天舒,王耀梅,崔明启,朱佩平,赵屹东,黎刚.滤光片及X射线二极管响应面均匀性研究[J].核电子学与探测技术,2001,21(2):104-107.
作者姓名:崔延莉  孙可煦  易荣清  黄天暄  杨家敏  丁永坤  丁耀南  曹磊峰  杨国洪  温天舒  王耀梅  崔明启  朱佩平  赵屹东  黎刚
作者单位:1. 中国工程物理研究院核物理与化学研究所高温、高密度等离子体物理重点实验室, 四川 绵阳919信箱986分箱 621900
2. 中国科学院高能物理研究所, 北京 100039
基金项目:高技术 863-416-3-4.6资助项目
摘    要:介绍了用于软X光能谱测量的滤光片及X射线二极管能量应均匀性研究。实验利用北京同步辐射装置3WIB束线,流强40-80mA的运行条件,在100-1600eV能区对滤光片及X射线二极管(XRD)作能响曲线标定。重点对C滤片及Al阴极XRD的灵敏面作能响面均匀性研究,最后给出响应面均匀性测量结果及计算分析。

关 键 词:滤光片  X射线二极管  响应面  均匀性  同步辐射装置  SXRES  惯性约束聚变  软X光能谱测量
文章编号:0258-0934(2001)02-0104-04
修稿时间:2000年1月5日

The study for surface uniformity of the response of the filter and X-ray diode
CUI Yan li ,SUN Ke xu ,YI Rong qing ,HUANG Tian xuan ,YANG Jia min ,DING Yong kun ,DING Yao nan,CAO Lei feng ,YANG Guo hong,WEN Tian shu ,WANG Yao mei ,CUI Ming qi ,ZHU Pei ping ,ZHAO Yi dong ,LI Gang.The study for surface uniformity of the response of the filter and X-ray diode[J].Nuclear Electronics & Detection Technology,2001,21(2):104-107.
Authors:CUI Yan li  SUN Ke xu  YI Rong qing  HUANG Tian xuan  YANG Jia min  DING Yong kun  DING Yao nan  CAO Lei feng  YANG Guo hong  WEN Tian shu  WANG Yao mei  CUI Ming qi  ZHU Pei ping  ZHAO Yi dong  LI Gang
Abstract:The study of surface uniformity of the response of the filter andX-ray diode to measure soft X-ray spectrum is reported. The Beijing synchrotron radiation facility-3W1B with beam current 40~80mA, and photon energy 100~1600eV is used. The energy response for the filter and X-ray diode has been calibrated. Primarily, the surface uniformity of response for carbon filter and X-ray diode with aluminum cathode have been studied. Finally, the experimental curve of the surface uniformity for the C-filter and XRD(Al) are given and analyzed.
Keywords:filter X  ray diode  surface uniformity of response  synchrotron radiation facility
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