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基于白光光谱仪的绝对距离测量方法的研究
引用本文:王留留,刘志健,刘文其,何胖泮.基于白光光谱仪的绝对距离测量方法的研究[J].仪器仪表用户,2009,16(4):6-7.
作者姓名:王留留  刘志健  刘文其  何胖泮
作者单位:合肥工业大学,仪器科学与光电工程学院,合肥,230009
摘    要:本文介绍利用一种白光光谱仪测量绝对距离和位移的方法。利用迈克耳逊干涉结构。使用光谱仪S2000。进行光谱分析。在知道光学元件的群折射率和厚度的情况下,利用均衡波长的概念就可以得出绝对距离。该方法不需要应用相位重现程序,其测量范围大大超过传统白光干涉技术的测量范围。为绝对距离的测量提供一些详尽的参考。

关 键 词:绝对距离测量  均衡波长  白光  光谱仪

Research on measurement of absolute distances and displacements by an interferometric technique using a white-light spectral interferometer
WANG Liu-liu,LIU Zhi-jian,LIU Wen-qi,HE Pang-pan.Research on measurement of absolute distances and displacements by an interferometric technique using a white-light spectral interferometer[J].Electronic Instrumentation Customer,2009,16(4):6-7.
Authors:WANG Liu-liu  LIU Zhi-jian  LIU Wen-qi  HE Pang-pan
Affiliation:Hefei University of Technology;Hefei 230009;China
Abstract:This article introduces a measurement of absolute distances and displacements by an interferometric technique using a white-light fiber optic spectrometer.Employing a dispersive Michelson interferometer and a low-resolution spectrometer and with different amounts of dispersion in the interferometer,and knowing dispersion in the interferometer and the bandpass of the spectrometer,the absolute distance can be measured.The new technique extends the use of white-light spectral interferometer for distance and di...
Keywords:absolute distance measurement  equalization wavelength  white-light  spectrometer  
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