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Some physical properties of thin MgO films produced by reactive evaporation
Authors:S. Rakotomiraho  E. Charles  A. Boyer
Affiliation:(1) Laboratoire de Physique Appliquée, CEM, Université des Sciences et Techniques du Languedoc, PI. E. Bataillon, 34060 Montpellier Cedex, France
Abstract:Films of magnesium oxide were deposited by reactive evaporation using an electron gun. The films were polycrystalline with a preferential lang1 1 1rang orientation when their thickness was greater than 2mgrm. Based on the transmission coefficient in the visible and ultraviolet range, the optical gap was calculated to be E g=4.3 eV. The a.c. and d.c. electrical properties were evaluated using a single model: conduction by electron hopping from a trap level to extended states in the conduction band. The ionization energy of this trap level, which was clearly due to oxygen vacancies, was E i=(1.4±0.1) eV.
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