| 基于红外热像仪的涂层波段发射率测量 |
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| 引用本文： | 曹义,程海峰,郑文伟,才鸿年,成绍军.基于红外热像仪的涂层波段发射率测量[J].红外技术,2007,29(6):316-319. |
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| 作者姓名： | 曹义 程海峰 郑文伟 才鸿年 成绍军 |
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| 作者单位： | 1. 国防科技大学航天与材料工程学院重点实验室,湖南,长沙,410073
2. 国防科技大学航天与材料工程学院重点实验室,湖南,长沙,410073;兵器装备集团公司,北京,100081 |
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| 摘 要： | 简要介绍了红外热像仪测量涂层发射率的原理,详细介绍了基于红外热像仪的涂层波段发射率测量装置设计与测试方法,实际测试发射率0.708～0.920之间的4个标准样品,误差均不大于2.06%.
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| 关 键 词： | 红外 热像仪 发射率 红外热像仪 涂层发射率 波段 测量 Thermal Coatings Emissivity Wideband 误差 标准样品 实际测试 测试方法 装置设计 原理 |
| 文章编号： | 1001-8891（2007）06-0316-04 |
| 修稿时间： | 2007-04-03 |
Measure Wideband Emissivity of Coatings with Thermal Imager |
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| CAO Yi,CHENG Hai-feng,ZHENG Wen-wei,CAI Hong-nian,CHENG Shao-jun.Measure Wideband Emissivity of Coatings with Thermal Imager[J].Infrared Technology,2007,29(6):316-319. |
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| Authors: | CAO Yi CHENG Hai-feng ZHENG Wen-wei CAI Hong-nian CHENG Shao-jun |
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| Affiliation: | 1.College of Aerospace and Material Engineering, National Univ. of Defense Technology, Changsha Hunan 410073, China; 2.China South Industries Group Corp., Beijing 100081, China |
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| Abstract: | We introduced an infrared image denosing model based on Contourlet domain hidden Markov trees(CHMT) in terms of the fact that the infrared image Contourlet subbands coefficients satisfies the GGD(Generalized Gaussian Distribution)model.The algorithm applied to some kinds of infrared images and compared both in infrared image vision effect and peak value signal to noise ratio,the new algorithm shown better results especially in edge maintenance aspect. |
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| Keywords: | infrared thermal imager emissivity |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
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